ISTQB Exam ATM Topic 1 Question 42 Discussion

Actual exam question for ISTQB's ATM exam

Question #: 42
Topic #: 1

[All ATM Questions]

Which of the following information would you expect to be the most useful to perform a defect clustering analysis?

K2 1 credit

AThe trend in the lag time from defect reporting to resolution

BThe defect component information

CThe lifecycle phase in which the defect has been introduced

DThe defect removal efficiency information

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Suggested Answer: B

by Gregoria at Mar 21, 2024, 08:06 PM

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Ilene

12 months ago

I would argue that the defect removal efficiency information is crucial for defect clustering analysis. It shows us how effectively we are removing defects from our system.

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Sue

12 months ago

That's a valid point, Salena. Understanding which components are causing the most defects can definitely help in prioritizing fixes.

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Salena

1 years ago

I personally believe that knowing the defect component information is key for defect clustering analysis.

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Lauran

1 years ago

I agree with Sue. That information can help us identify patterns in our defect resolution process.

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Sue

1 years ago

I think the trend in the lag time from defect reporting to resolution would be the most useful.

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