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iSQI Exam CTAL-TM_Syll2012 Topic 1 Question 75 Discussion

Actual exam question for iSQI's CTAL-TM_Syll2012 exam
Question #: 75
Topic #: 1
[All CTAL-TM_Syll2012 Questions]

Which of the following information would you expect to be the most useful to perform a defect clustering analysis?

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Suggested Answer: C

by Daniel at Dec 07, 2024, 10:01 PM

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Abel
1 months ago
Defect clustering analysis, huh? Sounds like a job for Sherlock Holmes and his trusty sidekick, Watson. Elementary, my dear candidate!
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Novella
1 months ago
I'm torn between B and C, but I think I'll go with B. After all, you can't spell 'defect' without 'def', and that's where the action is!
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Shawn
1 months ago
Option C, the lifecycle phase where the defect was introduced, could also be really valuable. That information can help us understand when in the process the issues are arising.
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Ernie
19 days ago
D) The defect removal efficiency information is crucial to assess how effective the defect removal process is.
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Quentin
20 days ago
C) The lifecycle phase in which the defect has been introduced can help pinpoint where in the development process issues are originating.
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Mattie
23 days ago
B) The defect component information is important to understand which parts of the system are most prone to defects.
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Ettie
28 days ago
A) The trend in the lag time from defect reporting to resolution could be useful to identify patterns in how quickly issues are being resolved.
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Janella
2 months ago
I agree, option B is the way to go. Knowing the defect component details is crucial for identifying patterns and trends in the data.
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Paris
12 days ago
Yes, understanding the defect component can help us group similar defects together for analysis.
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Marcos
13 days ago
B) The defect component information
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Celeste
2 months ago
I personally believe that the defect removal efficiency information is crucial for defect clustering analysis.
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Amie
2 months ago
The defect component information seems like the most useful data point for a defect clustering analysis. Understanding where the defects are occurring can help pinpoint the root causes.
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Renay
1 days ago
D) The defect component information is indeed crucial for identifying the specific areas or components where defects are concentrated.
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Magnolia
3 days ago
C) Defect removal efficiency information can help in understanding how effective the current defect removal process is and where improvements can be made.
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Pansy
1 months ago
B) Knowing the lifecycle phase in which the defect has been introduced can provide insight into when and where in the process defects are most likely to occur.
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Lorrine
1 months ago
A) The trend in the lag time from defect reporting to resolution can also be useful to identify patterns in how long it takes to fix certain types of defects.
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Glory
2 months ago
I agree with Sue. Knowing how long it takes to resolve defects can help identify patterns.
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Sue
2 months ago
I think the trend in the lag time from defect reporting to resolution would be the most useful.
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