iSQI Exam CTAL-TM_Syll2012 Topic 1 Question 75 Discussion

Actual exam question for iSQI's CTAL-TM_Syll2012 exam

Question #: 75
Topic #: 1

[All CTAL-TM_Syll2012 Questions]

Which of the following information would you expect to be the most useful to perform a defect clustering analysis?

K2 1 credit

AThe trend in the lag time from defect reporting to resolution

BThe defect component information

CThe lifecycle phase in which the defect has been introduced

DThe defect removal efficiency information

Show Suggested Answer

Suggested Answer: C

by Daniel at Dec 07, 2024, 10:01 PM

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Janella

1 days ago

I agree, option B is the way to go. Knowing the defect component details is crucial for identifying patterns and trends in the data.

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Celeste

8 days ago

I personally believe that the defect removal efficiency information is crucial for defect clustering analysis.

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Amie

8 days ago

The defect component information seems like the most useful data point for a defect clustering analysis. Understanding where the defects are occurring can help pinpoint the root causes.

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Glory

9 days ago

I agree with Sue. Knowing how long it takes to resolve defects can help identify patterns.

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Sue

12 days ago

I think the trend in the lag time from defect reporting to resolution would be the most useful.

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