I'm pretty confident I know how to approach this. Capability analysis requires a large enough sample size to be statistically valid, so I'll need to make sure I have that.
This seems like a straightforward probability problem. I'll need to think through the likelihood of finding at least one defect in a sample of 30 items given the 0.2% defect rate.
I'm a bit confused on this one. I know the E bit has something to do with external routes, but I'm not sure how that relates to the different OSPF area types. I'll need to review my notes on that.
Beckie
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