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BCS Exam TM12 Topic 1 Question 98 Discussion

Actual exam question for BCS's TM12 exam
Question #: 98
Topic #: 1
[All TM12 Questions]

Which of the following information would you expect to be the most useful to perform a defect clustering analysis?

Number of correct responses: 1

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Suggested Answer: B

by Lorita at Sep 16, 2024, 04:23 PM

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Nana
9 months ago
I'm going with option C. Knowing where the defects are introduced is the best way to nip them in the bud, am I right or am I right?
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Noelia
9 months ago
Defect clustering analysis? More like defect herding analysis! Am I right, folks? But in all seriousness, I think B is the way to go.
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Carmela
9 months ago
C) The lifecycle phase in which the defect has been introduced
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Magda
9 months ago
B) The defect component information
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Lorean
9 months ago
A) The trend in the lag time from defect reporting to resolution
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Angelo
9 months ago
Option B, the defect component information, for sure. It's like finding a needle in a haystack - you need to know where to look first!
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Brett
8 months ago
C) The lifecycle phase in which the defect has been introduced
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Glynda
8 months ago
B) The defect component information
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Clay
9 months ago
A) The trend in the lag time from defect reporting to resolution
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Rozella
10 months ago
Hmm, this is a tough one. I'm leaning towards D, the defect removal efficiency information. That tells you how well your team is doing at catching and fixing bugs, which is key for improving the process.
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Billye
10 months ago
I would go with option C, the lifecycle phase in which the defect has been introduced. That gives you the best insight into when the issues are being introduced and where to focus your efforts.
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Reena
8 months ago
The trend in lag time can also be useful to track resolution speed.
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Christiane
8 months ago
I would also choose option C, it helps in identifying patterns.
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Myra
9 months ago
I think the defect removal efficiency information is important too.
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Valene
9 months ago
I agree, knowing when the defect was introduced is key.
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Flo
10 months ago
The defect component information (B) is definitely the most useful for defect clustering analysis. Knowing where the defects are occurring is crucial for identifying the root causes.
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Lashonda
9 months ago
Defect removal efficiency information can also help in understanding how effective the current process is.
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Marylyn
9 months ago
I think the lifecycle phase in which the defect has been introduced is also important to consider.
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Kris
10 months ago
I agree, knowing the defect component information is key to identifying patterns.
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Avery
10 months ago
I believe the defect removal efficiency information is also important. It can help us understand how effective our defect removal process is.
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Stephaine
10 months ago
I agree with Leandro. Knowing how long it takes to resolve defects can help identify patterns.
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Leandro
10 months ago
I think the trend in the lag time from defect reporting to resolution would be the most useful.
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