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ASTQB Exam CTFL Topic 4 Question 36 Discussion

Actual exam question for ASTQB's CTFL exam
Question #: 36
Topic #: 4
[All CTFL Questions]

Consider the following statements about early test design:

i. Early test design can prevent fault multiplication

ii. Faults found during early test design are more expensive to fix

iii. Early test design can find faults

iv. Early test design can cause changes to the requirements

v. Early test design takes more effort

Show Suggested Answer Hide Answer
Suggested Answer: B

Contribute your Thoughts:

Elouise
14 days ago
Option D all the way! Early test design is the key to success, like a superhero swooping in to save the day. Just don't forget your testing cape, am I right?
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Cyril
14 days ago
This is a tricky one! I'm leaning towards option E, but I can't shake the feeling that maybe early test design does take more effort. Decisions, decisions...
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Portia
16 days ago
Option C looks good to me. Early test design can find faults and cause changes to the requirements, but the other statements seem a bit shaky.
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Kenneth
2 days ago
I think option C is the best choice. It makes sense that early test design can find faults and cause changes to requirements.
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Micah
29 days ago
Hmm, let's see. Early test design can definitely prevent fault multiplication, but I'm not sure if it's more expensive to fix faults found during this stage. And does it really take more effort? I'm going to go with option A, it seems the most comprehensive.
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Timmy
17 days ago
User1: I think early test design can prevent fault multiplication.
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Dino
2 months ago
But doesn't early test design require more effort?
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Sharan
2 months ago
I agree with you, Chaya. It can also help in finding faults early on.
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Chaya
2 months ago
I think early test design is important for preventing fault multiplication.
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